» » » ECHOMETER 1076 TC Wall Thickness Gauge ECHOMETER 1076 TC Measurement also on coated material Additional measurement through coating is possible by evaluation of back wall echoes User-friendly menu-guidance, easy data storage and adaptable representation of readings: The new ECHOMETER 1076 TC measures wall thickness and sound velocity easily and reliably - even through coatings. Application Using the standard method (TP-BE mode) for measurement of wall thickness and sound velocity the probe is placed on the uncoated surface of the material. The ECHOMETER 1076 TC offers more: Varnish or plastics coatings up to 4 mm thickness can be blanked out so you can measure highly precise also through the coating.

Then the measuring result is calculated by means of successive back wall echoes. Depending on the probe the measuring range for wall thickness covers 0.5 to 400 mm. The measurement of sound velocity in sound conductive material copes with a measuring range from 100 to more than 20,000 m/s without any problems.

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Unaffected by coating: Measurement by evaluation of the transit times of back wall echoes (enlarged view: click on the image) Probes Besides a standard probe for the most common wall thicknesses from 1.2 to 250 mm a high-resolution probe for thin-walled workpieces from 0.5 to 25 mm and a low frequency probe for wall thicknesses up to 400 mm are available. The standard probe BE-BE can be used either for measurements using the TP-BE method (measuring range: 2 - 250 mm) or for through coating measurements (measuring range: 2 to 28 mm). The connected probe is automatically recognized by the gauge. The probes of the ECHOMETER 1076 TC Measurement also through coatings Quite often in materials testing, the specimens to be examined are protected by a varnish or plastics coating against environmental impact. With the standard measurement method (TP-BE) the ultrasound transit time between transmitter pulse and first back wall echo is measured. In this case, if you do not want to damage the protective layer, you have to rely on an estimation of the layer properties so the determined results will be correspondingly inaccurate.